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Radiated disturbance characteristics of SiC MOSFET module
Huazhen Huang  Ningyan Wang  Jialing Wu  Tiebing Lu
Vol. 21, No. 2, pp. 494-504, Feb. 2021
10.1007/s43236-020-00187-4

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  ISSN : 1598 - 2092
eISSN : 2093 - 4718